The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 2026
Filed:
Apr. 13, 2023
Mediatek Singapore Pte. Ltd., Singapore, SG;
Miao Wang, Beijing, CN;
Tsang-Wei Yu, Tsinchu City, TW;
MediaTek Singapore Pte. Ltd., Singapore, SG;
Abstract
Apparatus and methods are provided for configuring and applying measurement weight factor for inter-frequency measurements. In one novel aspect, the UE applies measurement weight factors for inter-frequency measurements within configured measurement gap occasions. In one embodiment, the UE receives one or more measurement configurations, which configure a plurality of measurement objects (MOs) to be measured in one or more measurement gaps, obtains a measurement weight factor for each MO, wherein a set of measurement weight factors is included in the one or more measurement configurations; and performs inter-frequency measurements within configured measurement gaps applying corresponding measurement weight factor for each MO. In one embodiment, the set of measurement weight factors are configured for each frequency layer or for each MO. In one embodiment, each measurement weight factor for the same MO is determined based on one or more weight conditions.