The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 2026

Filed:

Feb. 24, 2022
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Alexandros Manolakos, Escondido, CA (US);

Mukesh Kumar, Hyderabad, IN;

Fnu Siddhant, Bangalore, IN;

Pulkit Rajgadiya, Hyderabad, IN;

Srinivas Yerramalli, San Diego, CA (US);

Guttorm Ringstad Opshaug, Redwood City, CA (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 64/00 (2009.01); H04L 5/00 (2006.01); H04W 24/10 (2009.01);
U.S. Cl.
CPC ...
H04W 64/00 (2013.01); H04L 5/0051 (2013.01); H04W 24/10 (2013.01);
Abstract

Antenna hopping techniques for Positioning Reference Signal (PRS) measurements in positioning of a user equipment (UE) include, for each of a plurality of successive measurement instances, taking a set of measurements of a respective set of PRS resources during the respective measurement instance using only one subset of a plurality of subsets of antennas of the UE, such that different subsets of the plurality of subsets of antennas of the UE are used for different measurement instances of the plurality of successive measurement instances. Each subset comprises one or more, but fewer than all, antennas of the UE. Techniques include sending one or more measurement reports from the UE to a location server. Each of the one or more measurement reports may comprise: information indicative of a respective set of measurements, and a timestamp corresponding to the respective measurement instance during which the respective set of measurements were taken.


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