The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 2026

Filed:

Sep. 25, 2024
Applicant:

Tencent America Llc, Palo Alto, CA (US);

Inventors:

Stephan Wenger, Hillsborough, CA (US);

Arianne Hinds, Palo Alto, CA (US);

Assignee:

TENCENT AMERICA LLC, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 19/00 (2014.01); H04N 19/70 (2014.01); H04N 19/86 (2014.01);
U.S. Cl.
CPC ...
H04N 19/70 (2014.11); H04N 19/86 (2014.11);
Abstract

A method and apparatus comprising computer code configured to cause a processor or processors to obtain video data including at least one coded picture; reconstruct a coded picture associated in the video data with a film grain characteristics SEI message, a first sample, a second sample, a third alpha map sample, and a fourth alpha map sample, wherein after reconstruction the first sample and the third alpha map sample, and the second sample and fourth sample are spatially co-located; apply film grain synthesis to the first sample based on a first value of the third sample; and determine to not apply film grain syntheses to the second sample based on a second value of the fourth sample, wherein the first value and second value are different from each other.


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