The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 2026
Filed:
Mar. 20, 2024
Qualcomm Incorporated, San Diego, CA (US);
Yunfei Feng, San Diego, CA (US);
Li Liu, San Diego, CA (US);
Chuan Wang, San Diego, CA (US);
Vahid Dabbagh Rezaei, San Diego, CA (US);
Vinod Panikkath, San Diego, CA (US);
Alaaeldien Mohamed Abdelrazek Medra, San Diego, CA (US);
Anosh Davierwalla, San Diego, CA (US);
Xinmin Yu, San Diego, CA (US);
Muhammad Hassan, San Diego, CA (US);
Wu-Hsin Chen, San Diego, CA (US);
Sherif Hassan Kamel Embabi, Allen, TX (US);
QUALCOMM Incorporated, San Diego, CA (US);
Abstract
A method of self-testing a transceiver integrated circuit substrate includes: providing a test signal to a transmission line that is communicatively coupled, or selectively communicatively coupled, to an input of a power amplifier of a first transceiver subcircuit of the transceiver integrated circuit substrate; providing the test signal from the transmission line to an LNA of an LNA of a second transceiver subcircuit of the transceiver integrated circuit substrate; and measuring the test signal before amplification by the LNA, or after amplification by the LNA, or both.