The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 2026

Filed:

Sep. 19, 2023
Applicant:

Tecat Technologies (Suzhou) Limited, Suzhou Industrial Park Suzhou, CN;

Inventor:

Choon Leong Lou, Singapore, SG;

Assignee:

TECAT TECHNOLOGIES (SUZHOU) LIMITED, Suzhou Industrial Park Suzhou, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/073 (2013.01); H04B 10/50 (2013.01);
U.S. Cl.
CPC ...
H04B 10/0731 (2013.01); H04B 10/502 (2013.01);
Abstract

The present disclosure provides an optical signal processing device configured to measure wafer-scale micro LEDs, including optical signal testing units and an optical signal sensing device. The optical signal testing units are configured to transmit optical signals generated by micro LEDs. An optical signal testing unit transmits an optical signal generated by a micro LED. The optical signal sensing device is configured to sense the optical signals transmitted by the optical signal testing units during a plurality of time periods, and is configured to generate sensing signals according to the optical signals.


Find Patent Forward Citations

Lou, Choon. (2026). Optical signal processing device and optical signal measurement method (U.S. Patent No. 12676670). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12676670

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…