The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 2026

Filed:

Jul. 14, 2023
Applicants:

Hainan Institute of Zhejiang University, Sanya City, CN;

Zhejiang University, Zhejiang, CN;

Inventors:

Yong He, Sanya, CN;

Xiaoyue Du, Sanya, CN;

Liyuan Zheng, Sanya, CN;

Liwen He, Sanya, CN;

Shuiguang Deng, Sanya, CN;

Chongde Sun, Sanya, CN;

Assignees:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G08G 5/30 (2025.01); G06V 20/10 (2022.01); G06V 20/17 (2022.01);
U.S. Cl.
CPC ...
G08G 5/30 (2025.01); G06V 20/17 (2022.01); G06V 20/194 (2022.01);
Abstract

The present disclosure provides a method and system for determining an optimal flight height of an unmanned aerial vehicle (UAV), an electronic device, and a medium. The method includes: obtaining a multi-band crop spectral image of an experimental area in a preset scenario; performing data processing on the multi-band crop spectral image, to obtain multi-spectral orthographies of a plurality of sample plots; calculating a ground resolution of the multi-spectral orthography of each sample plot, simulating and determining a multi-band crop spectral image of each sample plot at a different flight height by a nearest neighbor interpolation method based on the ground resolution of the multi-spectral orthography of each sample plot; and for the multi-band crop spectral image of each sample plot at the different flight height, determining an optimal flight height corresponding to each sample plot by a hypothetical test method.


Find Patent Forward Citations

Loading…