The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 2026
Filed:
Aug. 07, 2023
Nvidia Corporation, Santa Clara, CA (US);
Alexander Popov, Kirkland, WA (US);
David Nister, Bellevue, WA (US);
Nikolai Smolyanskiy, Seattle, WA (US);
Patrik Gebhardt, Cupertino, CA (US);
Ke Chen, Mountain View, CA (US);
Ryan Oldja, Issaquah, WA (US);
Hee Seok Lee, Seongnam-si, KR;
Shane Murray, San Jose, CA (US);
Ruchi Bhargava, Redmond, WA (US);
Tilman Wekel, San Jose, CA (US);
Sangmin Oh, San Jose, CA (US);
NVIDIA Corporation, Santa Clara, CA (US);
Abstract
Systems and methods are disclosed that relate to freespace detection using machine learning models. First data that may include object labels may be obtained from a first sensor and freespace may be identified using the first data and the object labels. The first data may be annotated to include freespace labels that correspond to freespace within an operational environment. Freespace annotated data may be generated by combining the one or more freespace labels with second data obtained from a second sensor, with the freespace annotated data corresponding to a viewable area in the operational environment. The viewable area may be determined by tracing one or more rays from the second sensor within the field of view of the second sensor relative to the first data. The freespace annotated data may be input into a machine learning model to train the machine learning model to detect freespace using the second data.