The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 2026

Filed:

Oct. 06, 2022
Applicant:

Vito NV, Mol, BE;

Inventor:

Roeland Geurts, Mol, BE;

Assignee:

VITO NV, Mol, BE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06V 20/50 (2022.01); B07C 5/34 (2006.01); G01N 23/04 (2018.01); G01N 23/083 (2018.01); G06V 10/26 (2022.01); G06V 10/764 (2022.01);
U.S. Cl.
CPC ...
G06V 20/50 (2022.01); B07C 5/3416 (2013.01); G01N 23/04 (2013.01); G01N 23/083 (2013.01); G06V 10/26 (2022.01); G06V 10/764 (2022.01); B07C 2501/0054 (2013.01); G01N 2223/401 (2013.01); G01N 2223/643 (2013.01);
Abstract

A method and system for performing characterization of one or more materials. The one or more materials are scanned by means of a sensory unit including an x-ray sensor for obtaining at least one x-ray image. Segmentation of the at least one x-ray image is performed in order to separate one or more distinct objects in the at least one x-ray image. In the at least one x-ray image, segmented objects are selected. For each of the selected segmented objects in the at least one x-ray image, a transformation using a transformation model is computed, wherein each transformation is indicative of a three dimensional reconstruction of the respective selected segmented object in the at least one x-ray image. The selected segmented objects are characterized based upon its computed transformation.


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