The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 2026
Filed:
May. 22, 2023
Applicant:
Konica Minolta, Inc., Tokyo, JP;
Inventors:
Satoru Inoue, Kunitachi, JP;
Shoichi Uratani, Hino, JP;
Assignee:
KONICA MINOLTA, INC., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/44 (2022.01); G06T 7/73 (2017.01); G06V 10/46 (2022.01); G06V 10/56 (2022.01); G06V 10/74 (2022.01); G06V 10/77 (2022.01);
U.S. Cl.
CPC ...
G06T 7/74 (2017.01); G06V 10/443 (2022.01); G06V 10/462 (2022.01); G06V 10/56 (2022.01); G06V 10/761 (2022.01); G06V 10/7715 (2022.01);
Abstract
An impression analysis system includes: an input obtainer that receives an evaluation target image; and a hardware processor, wherein the hardware processor: extracts a low-order image feature amount, and a high-order image feature amount, from the evaluation target image, and compares data obtained by extracting a low-order image feature amount and a high-order image feature amount from a reference image associated with an impression evaluation, with data of the image feature amounts extracted by a feature amount extractor, and calculates a similarity between the evaluation target image and the reference image.