The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 2026

Filed:

Feb. 21, 2024
Applicant:

Sap SE, Walldorf, DE;

Inventors:

Xinyan Chen, Singapore, SG;

Yinan He, Singapore, SG;

Rajesh Vellore Arumugam, Singapore, SG;

Anantharaman Ravi, Singapore, SG;

Assignee:

SAP SE, Walldorf, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06F 40/40 (2020.01); G06T 7/10 (2017.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G06F 40/40 (2020.01); G06T 7/10 (2017.01); G06T 2207/30108 (2013.01);
Abstract

Methods, systems, and computer-readable storage media for receiving a product image depicting a product that is to-be-inspected for defects, transmitting a request to a LLM system, the request including the product image and a reference image, receiving, from the LLM system, a textual response, the textual response being generated by the LLM system at least partially by processing the product image and the reference image, processing the textual response and the product image through a RIS model to provide an output image that includes one or more masks, each mask indicating a defect in a product depicted in the product image, and providing the output image with an indication that the product is defective.


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