The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 2026
Filed:
Nov. 25, 2022
Zte Corporation, Shenzhen, CN;
Shanghai Jiao Tong University, Shanghai, CN;
Yiling Xu, Shenzhen, CN;
Qi Yang, Shenzhen, CN;
Yujie Zhang, Shenzhen, CN;
Yunfeng Guan, Shenzhen, CN;
Jun Sun, Shenzhen, CN;
Zhao Wu, Shenzhen, CN;
Ying Gao, Shenzhen, CN;
Ping Wu, Shenzhen, CN;
ZTE CORPORATION, Shanghai, CN;
SHANGHAI JIAO TONG UNIVERSITY, Shanghai, CN;
Abstract
Provided are a point cloud quality evaluation method and device and a storage medium. The method includes: selecting the target number of reference point cloud regions from a reference point cloud according to a preset region selection rule (S); selecting to-be-evaluated point cloud regions respectively corresponding to the target number of reference point cloud regions from a to-be-evaluated point cloud corresponding to the reference point cloud (S); successively performing at least one scale transformation on the reference point cloud region and a respective to-be-evaluated point cloud region to generate corresponding new reference point cloud regions and corresponding new to-be-evaluated point cloud regions (S); separately performing a quality evaluation on each new reference point cloud region and a respective new to-be-evaluated point cloud region to obtain a corresponding quality evaluation value (S); and fusing all quality evaluation values to obtain a corresponding multi-scale quality evaluation value (S).