The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 2026

Filed:

Jun. 20, 2023
Applicant:

Capital One Services, Llc, McLean, VA (US);

Inventors:

Samuel Sharpe, Cambridge, MA (US);

Christopher Bayan Bruss, Washington, DC (US);

Brian Barr, Schenectady, NY (US);

Assignee:

Capital One Services, LLC, McLean, VA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 5/025 (2023.01); G06N 3/0475 (2023.01); G06N 5/045 (2023.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06N 5/025 (2013.01); G06N 3/0475 (2023.01); G06N 5/045 (2013.01); G06N 20/00 (2019.01);
Abstract

A method and related system operations include determining a predicted category by providing a prediction model with a set of input feature values and generating a plurality of conditionals based on the set of input feature values for a set of features and the predicted category. The method also includes filtering the plurality of conditionals based on a knowledge base to obtain a selected conditional by generating a set of sub-conditional paths by providing, as an input for a prompt generator model, a candidate conditional of the plurality of conditionals to the prompt generator model and selecting the candidate conditional as the selected conditional based on a determination that the set of sub-conditional paths satisfies a set of criteria associated with a set of sequences of the knowledge base. The method further includes storing the selected conditional in a data structure in association with the set of input feature values.


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