The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 2026

Filed:

May. 25, 2020
Applicant:

Nec Corporation, Tokyo, JP;

Inventor:

Seiya Shibata, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 3/0464 (2023.01); G06N 3/048 (2023.01);
U.S. Cl.
CPC ...
G06N 3/0464 (2023.01); G06N 3/048 (2023.01);
Abstract

The 1 dimensional data generation meansgenerates 1 dimensional data, by setting the number of elements of each dimension other than predetermined one dimension to 1 based on multidimensional data corresponding to one input data. The number of elements reducing meansreduces the number of elements included in the 1 dimensional data. The copy meansgenerates multidimensional data, by copying the 1 dimensional data whose number of elements has been reduced multiple times. The convolution layer processing meansperforms a convolution layer process with a filter size of 1×1 on the multidimensional data generated by the copy means. The element-wise product operation meansperforms an element-wise product operation, based on the multidimensional data corresponding to one input data and multidimensional data generated by the above process.


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