The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 2026

Filed:

Nov. 14, 2024
Applicant:

Jpmorgan Chase Bank, N.a., New York, NY (US);

Inventors:

Wen Yu Kon, Singapore, SG;

Ignatius William Primaatmaja, Singapore, SG;

Kaushik Chakraborty, Singapore, SG;

Ci Wen Lim, Singapore, SG;

Marco Pistoia, Amawalk, NY (US);

Assignee:

JPMORGAN CHASE BANK, N.A., New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/62 (2013.01); H04L 9/08 (2006.01); H04L 9/32 (2006.01);
U.S. Cl.
CPC ...
G06F 21/6227 (2013.01); H04L 9/0852 (2013.01); H04L 9/3271 (2013.01);
Abstract

A method may include: a first verifier receiving a request for position verification comprising a claimed position from a prover electronic device; the first verifier generating two first bitstrings and sending one of the bitstrings to a second verifier; the prover preparing two entangled quantum systems and sending one of the quantum systems to the first verifier; the first verifier measuring the first quantum system; each of the first verifier and the second verifier sending one of the bitstrings to the prover electronic device so that they arrive at the claimed position at the same time; the prover electronic device measuring the second quantum system and sending responses to the two verifiers with the measurement; the first verifier confirming that the responses were received within an expected time window and are valid.


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