The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 2026

Filed:

Feb. 20, 2023
Applicant:

Dell Products L.p., Round Rock, TX (US);

Inventors:

Joseph Shi, Shanghai, CN;

Xiaowei Shen, Shanghai, CN;

Jinghui Zhang, Shanghai, CN;

Shuyu Zhao, Shanghai, CN;

Assignee:

Dell Products L.P., Round Rock, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01); G06F 11/3668 (2025.01);
U.S. Cl.
CPC ...
G06F 11/079 (2013.01); G06F 11/3684 (2013.01); G06F 11/3692 (2013.01);
Abstract

A disclosed method defines root cause failure categories for a test case and associates each category with a corresponding test configuration property. Test configuration property information, indicative of the test configuration properties, are embedded in test case metadata. After generating test results, including test script messages, the test script messages assessed to identify the 'N' most significant keywords in the message. The significance of a term in the test script message may be calculated based on an inverse document frequent parameter, independent of the term frequency within the document. Test result groups may then be determined by invoking a suitable clustering algorithm, e.g., a k-means clustering algorithm, to cluster the test script messages based on their corresponding keyword sets. Hypothesis test statistics may then be calculated for each test result group. A most probable root cause may then be identified for some or all of the test result groups.


Find Patent Forward Citations

Shi, Joseph. (2026). Identifying root causes of test failures (U.S. Patent No. 12675358). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12675358

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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