The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 2026

Filed:

Apr. 11, 2022
Applicant:

Hewlett Packard Enterprise Development Lp, Houston, TX (US);

Inventors:

Srikant Varadan, San Jose, CA (US);

Alex Veprinsky, San Jose, CA (US);

Anirudha Kumar, San Jose, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/00 (2006.01); G06F 3/06 (2006.01); G06F 9/50 (2006.01);
U.S. Cl.
CPC ...
G06F 9/5083 (2013.01); G06F 3/0604 (2013.01); G06F 3/0635 (2013.01); G06F 3/067 (2013.01); G06F 9/5016 (2013.01); G06F 9/5044 (2013.01);
Abstract

In some examples, a system samples a subset of input/output (I/O) accesses of a storage, the I/O accesses being part of a workload. The system determines, based on the sampled subset of the I/O accesses, a first reuse distance distribution for a first time interval, determines a similarity measure representing a similarity of the first reuse distance distribution and a second reuse distance distribution for a second time interval different from the first time interval, and based on a change in the similarity measure, triggers a workload placement process to determine a placement of the workload on a compute node of a plurality of compute nodes.


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