The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 2026
Filed:
May. 24, 2024
Schneider Electric Usa, Inc., Boston, MA (US);
Lanyon Carr, Gold River, CA (US);
Chennan Li, Newark, CA (US);
Jon A. Bickel, Murfreesboro, TN (US);
Mostafa Parham Khosh, Mesa, AZ (US);
Mohamed Samir Abd-Elgaber Mostafa, Obour City, EG;
Babar Iftikhar, Abu Dhabi, AE;
SCHNEIDER ELECTRIC USA, INC., Boston, MA (US);
SCHNEIDER ELECTRIC SYSTEMS USA, INC., Foxborough, MA (US);
Abstract
Systems and methods for simultaneously analyzing time-series and dominant frequency data from both a process domain and an electrical domain of a facility, such as an industrial plant, to detect instances of deviation from optimal, normal, or other predefined process conditions or electrical trips. Detecting when changes in frequencies occur in the time-series data creates a time-series of the changes in dominant frequencies. A data analysis server detects instances of deviation from the predefined process conditions or electrical trips by detecting one or more of correlations, patterns, clusters, and the like in the rates of change. The data analysis server employs one or more of statistical analyses, data mining, machine learning, deep neural networks, parallel coordinate analyses, etc. to identify the deviations and predict or detect onset of an undesired event such as a process perturbation or electrical trip.