The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 2026
Filed:
Aug. 30, 2024
Fujifilm Corporation, Tokyo, JP;
Masaaki Suzuki, Minamiashigara, JP;
Koji Iijima, Minamiashigara, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
Provided is a diffraction element having excellent aligning properties of a liquid crystal compound. The diffraction element includes an optically-anisotropic layer that has a liquid crystal alignment pattern in which an orientation of an optical axis derived from a liquid crystal compound changes while continuously rotating in at least one in-plane direction, in which a birefringence Δn of the optically-anisotropic layer is 0.20 or more, the optically-anisotropic layer includes a surfactant, and in a case where components in a depth direction are analyzed by time-of-flight secondary ion mass spectrometry from one surface to another surface of the optically-anisotropic layer, a depth-direction profile of a secondary ion intensity derived from the surfactant is obtained, a position corresponding to a thickness of 20% from the one surface of the optically-anisotropic layer is represented by a position D, a position corresponding to a thickness of 80% from the one surface is represented by a position D, and an average value of secondary ion intensities derived from the surfactant between the position Dand the position Dis calculated, in a region from the position Dto the position D, a peak having a size of 1.1 times or more the average value is observed and a peak having a size of 5 times or more the average value is not observed.