The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 2026

Filed:

Jan. 17, 2024
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Gyosoo Choo, Suwon-si, KR;

Kiwhan Song, Suwon-si, KR;

Sunghun Kim, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2884 (2013.01);
Abstract

A method of detecting an opening of a semiconductor device includes generating a clock signal based on a probe of a measuring circuit contacting, via a switch, an end of a detection structure, measuring a period of the clock signal, counting a number of periods of the clock signal during a reference time interval, and determining, based on the number of periods of the clock signal, a location of the opening of the semiconductor device. The detection structure being formed in a semiconductor die of the semiconductor device in an annular shape.


Find Patent Forward Citations

Choo, Gyosoo. (2026). Method of detecting opening of semiconductor device including detection structure and semiconductor device (U.S. Patent No. 12674838). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12674838

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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