The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 2026

Filed:

Sep. 11, 2023
Applicant:

Abb Schweiz Ag, Baden, CH;

Inventors:

Olli Alkkiomäki, Helsinki, FI;

Panagiotis Kakosimos, Västerås, SE;

Kari Tikkanen, New Berlin, FI;

Teppo Pirttioja, Helsinki, FI;

Aleksi Vulli, Helsinki, FI;

Assignee:

ABB SCHWEIZ AG, Baden, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2020.01); G01K 1/02 (2021.01); G01K 1/022 (2021.01); G01K 7/22 (2006.01); G01K 13/00 (2021.01); G01R 31/28 (2006.01); G01R 31/70 (2020.01); H02P 3/24 (2006.01); H02P 29/68 (2016.01); H05K 7/20 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2642 (2013.01); G01R 31/2812 (2013.01); G01R 31/70 (2020.01); G01K 1/022 (2013.01); G01K 1/026 (2013.01); G01K 7/22 (2013.01); G01K 13/00 (2013.01); H02P 3/24 (2013.01); H02P 29/68 (2016.02); H05K 7/2089 (2013.01);
Abstract

A field of electric drive devices and arrangements including a plurality of power semiconductor components formed in or on a common substrate, and more particularly to a method and an apparatus for monitoring the condition of a power semiconductor module. The method for monitoring the condition of a power semiconductor module of an electric drive device connected to an electric machine includes the steps of engaging a locking of the rotor of the electric machine at zero speed or at near zero speed by injecting DC currents by the electric drive device, initiating test temperature recording in the power semiconductor module, disengaging the locking the rotor of the electric machine by the electric drive device, terminating the test temperature recording and storing the recorded data of the test temperature as test temperature data, and determining the condition of the power semiconductor module utilising the test temperature data.


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