The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 2026
Filed:
Dec. 16, 2022
Applicant:
Sysmex Corporation, Kobe, JP;
Inventors:
Naoya Kameyama, Kobe, JP;
Tomoyuki Nishida, Kobe, JP;
Yasuhiro Takeuchi, Kobe, JP;
Takayuki Arai, Kobe, JP;
Masahiro Mimura, Kobe, JP;
Assignee:
SYSMEX CORPORATION, Hyogo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/00 (2006.01);
U.S. Cl.
CPC ...
G01N 35/0092 (2013.01); G01N 35/00732 (2013.01); G01N 35/00871 (2013.01); G01N 2035/00851 (2013.01); G01N 2035/00891 (2013.01);
Abstract
Disclosed is a specimen analysis method for analyzing a specimen regarding a plurality of measurement items, the specimen analysis method comprising: measuring a first measurement item and a second measurement item on the basis of a measurement order; executing a process related to a time difference between a measurement of the first measurement item and a measurement of the second measurement item; and obtaining a calculation value from a measurement value of the first measurement item and a measurement value of the second measurement item.