The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 2026

Filed:

Dec. 08, 2025
Applicant:

Hme Square Inc., Daejeon, KR;

Inventors:

Yoonho Khang, Yongin-si, KR;

Duhyoun Yoon, Seoul, KR;

Jinsoo Park, Hwaseong-si, KR;

Jinwoong Lee, Hwaseong-si, KR;

Assignee:

HME SQUARE INC., Daejeon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/24 (2006.01);
U.S. Cl.
CPC ...
G01N 29/2418 (2013.01); G01N 29/2431 (2013.01);
Abstract

Provided is a photoacoustic measuring apparatus. The apparatus comprises an ultrasonic sensor configured to detect a photoacoustic wave generated in a photoacoustic wave generating area in the measurement target in a predetermined frequency band, wherein with a light-incident position and a beam width of the laser light, a center of the photoacoustic wave generating area, and a position of the ultrasonic sensor given according to a predetermined geometry, the frequency band of the ultrasonic sensor may be configured to include a frequency corresponding to a wavelength equal to twice the beam width at the point of light incidence.


Find Patent Forward Citations

Khang, Yoonho. (2026). Photoacoustic measuring apparatus (U.S. Patent No. 12674782). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12674782

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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