The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 2026

Filed:

Aug. 30, 2024
Applicant:

Seethru Ai Inc., Chelmsford, MA (US);

Inventor:

Omar Al-Kofahi, Chelmsford, MA (US);

Assignee:

SEETHRU AI INC., Chelmsford, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/203 (2006.01); G01N 23/20008 (2018.01);
U.S. Cl.
CPC ...
G01N 23/20008 (2013.01); G01N 2223/33 (2013.01);
Abstract

Presently disclosed is an x-ray scanning system and method for inspecting an object. The system has a first mobile x-ray scanner configured for scatter imaging and to generate a first compilation of scan data of a first side of the object. A second x-ray scanner is configured for imaging and generating a second compilation of scan data of a second side of the object. A movement device is configured and disposed to move at least one of the first scanner, the second scanner, and the object being scanned, during the scanning of the object. A data integrator is configured and disposed to receive and integrate the first compilation of scan data and the second compilation of scan data.


Find Patent Forward Citations

Al-Kofahi, Omar. (2026). X-ray scanning system and method for inspecting an object (U.S. Patent No. 12674769). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12674769

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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