The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 2026

Filed:

Sep. 09, 2024
Applicants:

Korea University Research and Business Foundation, Seoul, KR;

Institute for Basic Science, Daejeon, KR;

Inventors:

Won Shik Choi, Seoul, KR;

Sung Sam Kang, Seoul, KR;

Seok Chan Yoon, Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01); G01N 21/47 (2006.01); G01N 33/02 (2006.01); G01N 33/483 (2006.01); G06T 5/80 (2024.01);
U.S. Cl.
CPC ...
G01N 21/4738 (2013.01); G01N 33/025 (2013.01); G01N 33/4833 (2013.01); G06T 5/80 (2024.01); G06T 2207/10056 (2013.01);
Abstract

Disclosed are an imaging device for correcting and reconstructing a target image in a scattering medium using a multiple scattering tracing algorithm based on a reflection matrix and a method thereof. According to an embodiment of the present disclosure, the imaging device corrects and reconstructs an image of a target object located deep inside a scattering medium such as a biological tissue by tracing a multiple scattering trajectory using a time-resolved reflection matrix obtained from an imaging device that uses a time-resolved light source and then correcting it.


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