The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 2026
Filed:
Mar. 02, 2022
Suzhou Nuclear Power Research Institute Co., Ltd., Suzhou, CN;
China General Nuclear Power Group, Shenzhen, CN;
Cgn Power Co., Ltd., Shenzhen, CN;
Xiangbing Liu, Suzhou, CN;
Yuanfei Li, Suzhou, CN;
Chaoliang Xu, Suzhou, CN;
Wenqing Jia, Suzhou, CN;
Jian Yin, Suzhou, CN;
Qiwei Quan, Suzhou, CN;
Wangjie Qian, Suzhou, CN;
SUZHOU NUCLEAR POWER RESEARCH INSTITUTE CO., LTD., Suzhou, CN;
CHINA GENERAL NUCLEAR POWER GROUP, Shenzhen, CN;
CGN POWER CO., LTD., Shenzhen, CN;
Abstract
A portable internal friction measuring instrument and internal friction measurement method, the portable internal friction measuring instrument comprising: a cavity (), a sample fixture (), a fixing plate (), a heating plate (), a thermal barrier cover (), an excitation assembly (), and a vibration sensor (). The excitation assembly () comprises a rotatable vibration impeller (), at least one protrusion is provided on the outer wall of the vibration impeller (), the lower edge of a sample () can be intermittently toggled by means of the protrusion during the rotation of the vibration impeller (), and the vibration amplitude of the sample () is determined by using an angle difference between emitted light and reflected light of the sample (), such that the technical effects of mechanical toggling to excite the vibration of the sample () and non-contact measurement of the vibration of the sample () are achieved.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile