The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 2026
Filed:
Aug. 14, 2024
Shanghai University, Shanghai, CN;
Tingyun Wang, Shanghai, CN;
Chuanlu Deng, Shanghai, CN;
Yi Huang, Shanghai, CN;
Xiaobei Zhang, Shanghai, CN;
Qi Zhang, Shanghai, CN;
Shanghai University, Shanghai, CN;
Abstract
A system for measuring roughness of a core sidewall of an optical waveguide based on mode excitation is provided, in which an optical waveguide to be measured is arranged between a few-mode long-period fiber grating and an optical power meter; the laser beam is incident on the optical waveguide to be measured after passing through the few-mode long-period fiber grating, and then is incident on the optical power meter after being subjected to a scattering loss caused by the roughness of the core sidewall of the optical waveguide to be measured; and the processor is configured to calculate an equivalent value of the roughness of the core sidewall according to the output power detected by the optical power meter, the output modes of the few-mode long-period fiber grating and the mode of the optical waveguide to be measured.