The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 2026
Filed:
Jul. 29, 2025
Guangdong University of Technology, Guangzhou, CN;
Jian Gao, Guangzhou, CN;
Zepan Chen, Guangzhou, CN;
Zhuojun Zheng, Guangzhou, CN;
Lanyu Zhang, Guangzhou, CN;
GUANGDONG UNIVERSITY OF TECHNOLOGY, Guangzhou, CN;
Abstract
A three-dimensional measurement method and apparatus for a structured light system based on system pose optimization is provided. The method includes acquiring multiple binary fringe modulations and performing intrinsic and extrinsic parameter calibration of a projector and a camera by using a preset visual positioning method to determine an initial inter-optical-center horizontal distance; calculating system distance magnification data based on each sinusoidal fringe image and the initial inter-optical-center horizontal distance; determining defocus phase undetermined coefficients based on each binary fringe modulation; applying a preset system pose optimization mathematical model to determine a target inter-optical-center horizontal distance based on the initial inter-optical-center horizontal distance, the system distance magnification data, and the defocus phase undetermined coefficients; and adjusting the system pose of the structured light system based on the target inter-optical-center horizontal distance, and constructing a three-dimensional model of an object to be measured based on the triangulation method.