The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 2026
Filed:
Jun. 21, 2021
Fanuc Corporation, Yamanashi, JP;
Masahide Yamaoka, Yamanashi-ken, JP;
Meguru Yamaguchi, Yamanashi-ken, JP;
FANUC CORPORATION, Yamanashi, JP;
Abstract
A processing machine is provided which can accurately evaluate the results of periodic inspection. This processing machine, for processing a workpiece, is provided with: an information storage unit which, as reference information, stores information that includes multiple pieces of in-process information, which indicate the processing state when the workpiece was subjected to inspection processing, and processing result information, which has been obtained by measuring the product obtained by the inspection processing; an acquisition unit which acquires comparison information, which includes the processing result information and the multiple pieces of in-process information in inspection processing that was carried out after the inspection processing for which the reference information was acquired; a comparison unit which compares the comparison information and the reference information; and a display control unit which displays on a display unit the results of comparison by the comparison unit.