The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 2026

Filed:

Jul. 16, 2024
Applicant:

Siemens Healthineers Ag, Forchheim, DE;

Inventors:

Andreas Fieselmann, Erlangen, DE;

Ramyar Biniazan, Nuremberg, DE;

Sven-Martin Sutter, Herzogenaurach, DE;

Magdalena Herbst, Erlangen, DE;

Assignee:

SIEMENS HEALTHINEERS AG, Forchheim, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2024.01); A61B 6/04 (2006.01); A61B 6/50 (2024.01); G06T 7/00 (2017.01); G06V 10/25 (2022.01); G06V 20/64 (2022.01); G06V 40/10 (2022.01);
U.S. Cl.
CPC ...
A61B 6/545 (2013.01); A61B 6/04 (2013.01); A61B 6/505 (2013.01); G06T 7/0012 (2013.01); G06V 10/25 (2022.01); G06V 20/653 (2022.01); G06V 40/103 (2022.01); G06T 2207/10116 (2013.01); G06T 2207/30008 (2013.01);
Abstract

A computer-implemented method for position control of an object under investigation before acquiring a projective X-ray image of a region of interest, the computer-implemented method comprising: receiving object information of the object under investigation in an examination pose; retrieving an object model relating to the examination pose and the region of interest; adapting the object model to the object under investigation based on the object information; and evaluating the examination pose based on the adapted object model.


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