The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2026

Filed:

Nov. 27, 2023
Applicant:

Gudeng Precision Industrial Co., Ltd., New Taipei City, TW;

Inventors:

Ming-Chien Chiu, New Taipei City, TW;

Yung-Chin Pan, New Taipei City, TW;

Tzu-Ning Huang, New Taipei City, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H10P 72/30 (2026.01); H10P 74/20 (2026.01);
U.S. Cl.
CPC ...
H10P 72/3402 (2026.01); H10P 74/203 (2026.01);
Abstract

A supporting structure and an inspection equipment thereof and a calibrating tool for the inspection equipment include backbone and parallel blocks in the supporting structure. The receiving trench is defined between two adjacent supporting portions on the backbone for receiving supporter. Each supporting portion has a first limiting portion and the supporter has a second limiting portion. The parallel block is disposed between the first and the second limiting portion to restrain relative movement of the supporter. The inspection equipment is used for inspecting the supporting structure and includes plural inspection regions for inspecting the deviation amount of the supporter based on how much the moving door travels towards the substrate carrier. The calibrating tool is used for calibrating the inspection equipment. Whether the inspection surface conforms with a calibration condition is inspected through the inspection regions based on how much the moving door travels toward the calibrating tool.


Find Patent Forward Citations

Chiu, Ming-Chien. (2026). Supporting structure and inspection equipment therefof and calibrating tool for inspection equipment (U.S. Patent No. 12672512). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12672512

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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