The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2026

Filed:

Dec. 01, 2022
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Jaewon Yang, Suwon-si, KR;

Seongjin Park, Suwon-si, KR;

Sangchul Yeo, Gwangsan-gu, KR;

Seonmin Rhee, Seoul, KR;

Hyeok Lee, Suwon-si, KR;

Sooryong Lee, Seoul, KR;

Seungju Han, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H10P 50/00 (2026.01); G03F 7/00 (2006.01); G06T 3/4007 (2024.01); G06V 10/46 (2022.01); G06V 10/82 (2022.01);
U.S. Cl.
CPC ...
H10P 50/691 (2026.01); G03F 7/70616 (2013.01); G06T 3/4007 (2013.01); G06V 10/46 (2022.01); G06V 10/82 (2022.01);
Abstract

A semiconductor device patterning method includes generating an input image by imaging information about a pattern of a sample, acquiring an output image of the pattern of the sample after a preset semiconductor process with respect to the sample, generating a predictive model through learning using a Deep Neural Network (DNN) with the input image and the output image, and predicting a pattern image after the semiconductor process for a pattern of a semiconductor device by using the predictive model.


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