The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 2026
Filed:
Nov. 08, 2023
Toyo Seikan Co., Ltd., Tokyo, JP;
Tatsuya Shirasaka, Kanagawa, JP;
TOYO SEIKAN CO., LTD., Tokyo, JP;
Abstract
There is provided an inspection device configured to inspect a printed state of an inspected object surface which is a printed metallic base. The inspection device includes: a processor; and a memory connected to the processor to be able to communicate with the processor, the processor being configured to: acquire inspection image data obtained by imaging the inspected object surface; measure an L* value for each of colors in an L*a*b* colorimetric system of the inspection image data; and inspect the printed state of the inspected object surface based on the L* value.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile