The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 2026
Filed:
Jul. 08, 2024
Nokia Technologies Oy, Espoo, FI;
Tachporn Sanguanpuak, Oulu, FI;
Frederick Vook, Naperville, IL (US);
Amir Mehdi Ahmadian Tehrani, Munich, DE;
Andrea Bonfante, Massy, FR;
Keeth Saliya Jayasinghe Laddu, Espoo, FI;
Nokia Technologies Oy, Espoo, FI;
Abstract
This document discloses a method and an apparatus to perform using a predicted sequence of beam measurement outputs for at least one observation window associated with at least one prediction window providing reference signal received power measurements to predict a beam prediction output; identifying that a prediction window of the at least one prediction window is overlapped with at least a portion of an observation window of the at least one observation window over a time period; and comparing the beam prediction output during the overlapped portion with measurements of the observation window during the overlapped portion to perform long term real time monitoring to determine at least one prediction output for use in a next time instant, wherein the determining is based on a predicted reference signal received power of the at least one prediction output being above a threshold.