The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2026

Filed:

Oct. 25, 2021
Applicant:

Denki Kogyo Company, Limited, Tokyo, JP;

Inventors:

Takayoshi Sasaki, Tokyo, JP;

Tanan Hongnara, Tokyo, JP;

Yoshiki Shirasawa, Tokyo, JP;

Katsumori Sasaki, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01Q 3/46 (2006.01); H01Q 15/14 (2006.01); H01Q 15/16 (2006.01); H01Q 15/24 (2006.01);
U.S. Cl.
CPC ...
H01Q 3/46 (2013.01); H01Q 15/148 (2013.01); H01Q 15/167 (2013.01); H01Q 15/248 (2013.01);
Abstract

An object of the present invention is to make it possible to flexibly adjust the incidence wave directivity in a vertical plane or a horizontal plane by making the incident directivity reconfigurable. Provided is a variable reflect array, having a variable mechanism unit configured to change interval between the plurality of supercells, and, the variable mechanism unit is configured to change one of an incidence angle and a reflection angle with respect to the electromagnetic wave of the predetermined wavelength, and, keep the other of the incidence angle and the reflection angle constant with respect to the electromagnetic wave of the predetermined wavelength, by changing the interval between the plurality of supercells.


Find Patent Forward Citations

Sasaki, Takayoshi. (2026). Variable reflect array, and method for designing variable reflector array (U.S. Patent No. 12671177). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12671177

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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