The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 2026
Filed:
Jun. 27, 2024
Uif (University Industry Foundation), Yonsei University, Seoul, KR;
Sungho Kang, Seoul, KR;
Ha Young Lee, Seoul, KR;
Abstract
The present embodiment relates to a memory failure analysis method that is performed by a memory test apparatus. The memory failure analysis method includes setting a test area of a memory under test (MUT), inputting a test pattern to the set test area, receiving a test result from the MUT, and an updating operation including operation (a) of storing failure information extracted from the test result and operation (b) of compressing, updating, and storing failure information, which is stored in a failure accumulator, using the stored failure information, wherein a first failure detector and a second failure detector alternately perform operation (a) and operation (b), and the test area is a non-linear area.