The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2026

Filed:

Aug. 31, 2022
Applicant:

Makeblock Co., Ltd., Shenzhen, CN;

Inventor:

Yuanxiu Zhang, Shenzhen, CN;

Assignee:

MAKEBLOCK CO., LTD., Shenzhen, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/22 (2022.01); G06T 7/00 (2017.01); H04N 1/00 (2006.01);
U.S. Cl.
CPC ...
G06V 10/225 (2022.01); G06T 7/0004 (2013.01); H04N 1/00676 (2013.01);
Abstract

A processing control method and apparatus, and a device are provided. The method comprises: obtaining a first image comprising a target processing pattern; adding a plurality of positioning identifiers on the periphery of the target processing pattern; obtaining a photography image of a printed matter to be processed which is placed on a processing platform, thereby obtaining a second image, the printed matter to be processed being obtained by performing printing processing on the first image in which the plurality of positioning identifiers are added; performing overlap matching on the first image and the second image in a preset coordinate system according to the plurality of positioning identifiers in the second image; and according to the contour of the target processing pattern in the first image subjected to overlap matching, processing the printed matter to be processed, thereby obtaining a target printed matter.


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