The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2026

Filed:

Sep. 29, 2023
Applicants:

Advanced Micro Devices, Inc., Santa Clara, CA (US);

Ati Technologies Ulc, Markham, CA;

Inventors:

Michael John Livesley, Milton Keynes, GB;

David William John Pankratz, Markham, CA;

Sean Keely, Austin, TX (US);

Andrew Erin Kensler, Bellevue, WA (US);

Assignees:

Advanced Micro Devices, Inc., Santa Clara, CA (US);

ATI Technologies ULC, Markham, CA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 15/06 (2011.01); G06T 17/00 (2006.01);
U.S. Cl.
CPC ...
G06T 15/06 (2013.01); G06T 17/005 (2013.01); G06T 2210/21 (2013.01);
Abstract

A technique for performing ray tracing operations is provided. The technique includes for a ray being tested for intersection with geometry associated with a bounding volume hierarchy, traversing to a pre-filtering node that includes information for filtering out triangles of a leaf node of the bounding volume hierarchy; evaluating a quantized ray that corresponds to the ray against quantized triangles of the pre-filtering node to filter out one or more triangles of the leaf node from consideration; and testing the triangles of the leaf node that are not filtered out and not testing the triangles of the leaf node that are filtered out.


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