The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2026

Filed:

Mar. 02, 2023
Applicant:

Covera Health, New York, NY (US);

Inventors:

Micha Kornreich, New York, NY (US);

Jinhyeong Park, Princeton, NJ (US);

Li Zhang, Princeton, NJ (US);

James Browning, Glen Ridge, NJ (US);

Jayashri Pawar, Mahwah, NJ (US);

Benjamin Odry, West New York, NJ (US);

Richard Herzog, New York, NY (US);

Assignee:

Covera Health, New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/774 (2022.01); G06T 7/00 (2017.01); G06T 7/11 (2017.01); G06V 10/25 (2022.01); G06V 10/26 (2022.01); G06V 10/764 (2022.01); G06V 10/82 (2022.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); G06T 7/11 (2017.01); G06V 10/25 (2022.01); G06V 10/267 (2022.01); G06V 10/764 (2022.01); G06V 10/774 (2022.01); G06V 10/82 (2022.01); G06T 2207/10116 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/20132 (2013.01); G06T 2207/30004 (2013.01); G06V 2201/03 (2022.01);
Abstract

Described are systems, techniques, and processes for pathology detection in radiological images. A process can include obtaining a radiological image corresponding to an imaged anatomical area. Based on processing the radiological image using a semantic segmentation neural network, a target map can be generated corresponding to a plurality of candidate anatomical defect locations within the cropped radiological image. At least one volume of interest (VOI) can be generated centered around a particular candidate anatomical defect location within the cropped radiological image. A classification neural network can be used to classify the particular candidate anatomical defect location within the cropped radiological image, wherein classifying the particular candidate anatomical defect location includes determining a pathology associated with the particular candidate anatomical defect location.


Find Patent Forward Citations

Kornreich, Micha. (2026). Mixed-format labels for pathology detection and localization in magnetic resonance (mr) imaging (U.S. Patent No. 12670585). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12670585

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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