The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2026

Filed:

Nov. 08, 2022
Applicant:

Irdeto B.v., Hoofddorp, NL;

Inventors:

Thomas Hickie, Hoofddorp, NL;

Shufei He, Hoofddorp, NL;

Assignee:

IRDETO B.V., Hoofddorp, NL;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01);
Abstract

Disclosed is a method for identifying whether a classification system is configured to use a specific machine-learning classification model. The method involves using the classification system to generate, for each test sample in a predetermined test set, a corresponding classification result, and identifying either (i) that the classification system is using the specific machine-learning classification model or (ii) that the classification system is not using the specific machine-learning classification model. The test set is associated with the specific machine-learning classification model and, for each test sample in the test set, there is a corresponding small modification for that test sample that causes a change in the classification result produced for that test sample using the specific machine-learning classification model.


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