The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 2026
Filed:
Feb. 10, 2022
Applicant:
Pegatron Corporation, Taipei City, TW;
Inventor:
Shih-Jen Chu, Taipei City, TW;
Assignee:
PEGATRON CORPORATION, Taipei City, TW;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 3/08 (2023.01); G06F 18/21 (2023.01); G06F 18/214 (2023.01); G06N 3/04 (2023.01);
U.S. Cl.
CPC ...
G06N 3/08 (2013.01); G06F 18/214 (2023.01); G06F 18/217 (2023.01); G06N 3/04 (2013.01);
Abstract
A model training apparatus, a model training method, and a computer-readable medium are provided. In the method, a labeled abnormal sample is inputted into an abnormal detecting model. The abnormal detecting model is based on an autoencoder structure. A reconstructed error between the abnormal sample and an output of the abnormal detecting model is maximized to optimize the abnormal detecting model.
Chu, Shih-Jen. (2026). Apparatus, method, and computer-readable medium of training abnormal detecting model (U.S. Patent No. 12670386). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12670386
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile