The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2026

Filed:

Oct. 30, 2024
Applicant:

Dell Products L.p., Round Rock, TX (US);

Inventors:

Javedh Jafferi Shaik, Rajahmundry, IN;

Ramaraju Penumetcha Sai Venka, Hyderabad, IN;

Bijan Mohanty, Austin, TX (US);

Hung Dinh, Austin, TX (US);

Assignee:

Dell Products L.P., Round Rock, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/2452 (2019.01); G06F 16/21 (2019.01); G06F 16/2455 (2019.01);
U.S. Cl.
CPC ...
G06F 16/24522 (2019.01); G06F 16/212 (2019.01); G06F 16/2455 (2019.01);
Abstract

In some implementations, a query system may receive a natural language prompt from a user. The query system may convert the natural language prompt into a structured query language (SQL) query using a large language model (LLM) and schema information associated with a monitoring database. The query system may execute the SQL query against the monitoring database to receive monitoring results. The query system may convert the monitoring results into a natural language response, using the LLM, for output to the user.


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