The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 2026
Filed:
Dec. 05, 2023
Amazon Technologies, Inc., Seattle, WA (US);
Vaibhav Kumar, Redmond, WA (US);
Mohammad Kachuee, Bellevue, WA (US);
Amin Fazeli, San Diego, CA (US);
Yibo Yao, Bellevue, WA (US);
Yu Chen, Manhasset, NY (US);
Saurabh Gupta, Seattle, WA (US);
Changmin Seo, Seattle, WA (US);
Xiang Li, Bellevue, WA (US);
Puyang Xu, Issaquah, WA (US);
Tenghao Huang, Los Angeles, CA (US);
AMAZON TECHNOLOGIES, INC., Seattle, WA (US);
Abstract
Devices and techniques are generally described for application shortlisting for language models. An LLM may determine a first goal of first query data. The LLM may generate first code data representing the first query data. First encoded data including a first encoded representation of the first goal and the first query data may be generated. A first application may be determined based at least in part on analysis of the first encoded data with respect to second encoded data representing the first application. A second application may be determined based at least in part on analysis of the first encoded data with respect to third encoded data representing the second application. First prompt data including the first query data, first data identifying the first application, and second data identifying the second application may be generated. The LLM may generate output data based at least in part on the first prompt data.