The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 2026
Filed:
Dec. 27, 2022
Industrial Technology Research Institute, Hsinchu, TW;
Wei-Yuan Hsieh, Taipei City, TW;
Ming-Xuan Wu, New Taipei City, TW;
Chia-Jui Hu, New Taipei City, TW;
INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE, Hsinchu, TW;
Abstract
A point cloud positioning error detection method, performed by a processing device, includes: obtaining a plurality of pieces of first point data and a target point cloud map, wherein the target point cloud map includes a plurality of pieces of target point data, registering the first point data and the target point data to obtain a plurality of pieces of second point data, selecting a plurality of pieces of third point data from the second point data according to a first default distance, calculating a plurality of matching scores of the third point data relative to the target point data, obtaining a plurality of step vectors corresponding to the third point data, respectively, when said registering converges, and obtaining a plurality of effective values according to directions of the step vectors, and outputting a localization fault detection result based on an intersection of the matching scores and the effective values.