The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2026

Filed:

Mar. 13, 2024
Applicant:

Feng Chia University, Taichung City, TW;

Inventors:

Yue-Der Lin, Taichung City, TW;

Yin-Sheng Chen, Taichung City, TW;

Assignee:

Feng Chia University, Taichung City, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/312 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 31/312 (2013.01); G01R 31/2841 (2013.01);
Abstract

A defect detection module comprises a signal emitting module, a transmitting electrode, a receiving electrode, and a signal processing module. The signal emitting module of the present invention emits a first signal. The first signal passes through the transmitting electrode, a medium and the receiving electrode to generate a second signal. The transmitting electrode, the medium and the receiving electrode forms a capacitance value corresponding to the medium which may be solid or comprising air. The signal processing module processes the second signal to obtain a detection result.


Find Patent Forward Citations

Lin, Yue-Der. (2026). Defect detection module (U.S. Patent No. 12669539). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12669539

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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