The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 2026
Filed:
Feb. 27, 2025
Ishida Co., Ltd., Kyoto, JP;
ISHIDA CO., LTD., Kyoto, JP;
Abstract
An X-ray inspection apparatus includes a transport unit that transports an article; an irradiation unit that irradiates the article, which is transported by the transport unit, with X-rays; a sensor unit that detects the X-rays; and a control unit that generates an inspection image including the article from a detection result of the X-rays by the sensor unit, and that inspects whether the article includes an abnormality, based on the inspection image. The control unit generates a pseudo-defect image including a virtual abnormality by changing pixel values of some pixels constituting the inspection image generated when the article is inspected, and checks validity of the inspection based on the pseudo-defect image.