The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2026

Filed:

Aug. 28, 2024
Applicant:

The Boeing Company, Arlington, VA (US);

Inventors:

Veniamin Stryzheus, Kent, WA (US);

Shereef Shehab, Seattle, WA (US);

Naman Shah, Seattle, WA (US);

William Talion Edwards, Wentzville, MO (US);

Assignee:

The Boeing Company, Arlington, VA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/88 (2006.01);
U.S. Cl.
CPC ...
G01N 21/8851 (2013.01); G01N 2021/8864 (2013.01); G01N 2021/8887 (2013.01);
Abstract

A surface inspection system for inspecting an inspection surface includes a three-dimensional (3D) scanner configured to scan the inspection surface and acquire a point cloud of points representing at least the localized portion. The localized portion includes a non-defective region and a suspect region at least partially surrounded by the non-defective region and potentially containing one or more defects. The surface inspection system includes a processor establishes a reference surface based on the points in the non-defective region and exclusive of the points in the suspect region, and the reference surface extends across the suspect region. The processor determine one or more characteristics of a shape of the point cloud relative to the reference surface within the suspect region.


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