The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2026

Filed:

Jan. 08, 2024
Applicant:

Wayne State University, Detroit, MI (US);

Inventor:

Jitao Zhang, Troy, MI (US);

Assignee:

Wayne State University, Detroit, MI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/63 (2006.01); G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
G01N 21/636 (2013.01); G02B 21/0032 (2013.01); G02B 21/008 (2013.01); G01N 2021/638 (2013.01);
Abstract

An apparatus for super-resolution Brillouin microscopy includes a probe laser that emits a first laser beam and a first objective lens that focuses the first laser beam onto a sample. The apparatus further includes a pump laser that emits a second laser beam and a second quarter-wave plate that receives the second laser beam. The apparatus further includes a depletion laser that emits a third laser beam that passes through a phase plate to modify its wavefront phase such that the third laser beam has a donut shape, and a second objective lens that focuses the second laser beam and the third laser beam onto the sample. Characteristically, the beam spot from the depletion laser is overlaid with the Gaussian-shape beam spots of the first laser beam and the second laser beam at the same focal plane. A detector is configured to detect a stimulated Brillouin gain signal and a stimulated Brillouin loss signal.


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