The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2026

Filed:

Jun. 16, 2023
Applicant:

Commissariat À L'énergie Atomique ET Aux Énergies Alternatives, Paris, FR;

Inventor:

François Deneuville, Grenoble, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 4/04 (2006.01); G01J 3/02 (2006.01);
U.S. Cl.
CPC ...
G01J 4/04 (2013.01); G01J 3/0208 (2013.01); G01J 3/0224 (2013.01);
Abstract

A system for determining an estimated degree of polarization of a radiation reflected) by a scene, including a first light source of a first electromagnetic radiation at a first frequency and rectilinearly polarized according to a first direction, a second light source of a second electromagnetic radiation at a second frequency greater than the first frequency and rectilinearly polarized according to a second direction non-parallel to the first direction, and a device of acquisition of an image of the radiation reflected by the scene including first pixels configured to capture the reflected radiation, each first pixel being covered with a rectilinear polarizer according to a third direction non-perpendicular to the first direction.


Find Patent Forward Citations

Deneuville, François. (2026). System for measuring an estimated degree of linear polarization of an electromagnetic radiation reflected by a scene (U.S. Patent No. 12669377). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12669377

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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