The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2026

Filed:

Mar. 07, 2024
Applicant:

Seiko Epson Corporation, Tokyo, JP;

Inventors:

Masahide Moriyama, Matsumoto, JP;

Masayoshi Miyakawa, Suwa, JP;

Toru Hayashi, Suwa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/02 (2006.01); G01J 3/06 (2006.01);
U.S. Cl.
CPC ...
G01J 3/0289 (2013.01); G01J 3/0267 (2013.01); G01J 3/06 (2013.01); G01J 2003/061 (2013.01);
Abstract

A color measurement apparatus to which a colorimeter that measures a color of a patch of a color measurement target is configured to be attached includes a support base that supports the color measurement target, a carriage that supports the colorimeter, a scanning mechanism portion that causes the carriage to perform scanning on the support base, and a control portion that controls the scanning mechanism portion, in which the carriage includes a support portion that has an opening portion that exposes a color measurement portion from the carriage in a state in which the colorimeter is supported, and a first measurement portion and a second measurement portion that are provided to interpose the opening portion, and the control portion specifies a position of the patch by measurement results of a measured portion by the first measurement portion and the second measurement portion.


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