The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 2026
Filed:
May. 24, 2023
Mettler-toledo, Llc, Columbus, OH (US);
Patrick Toohey, Cortland, NY (US);
Mettler-Toledo, LLC, Columbus, OH (US);
Abstract
Checkweigher performance learning systems and methods are provided. Noise data for checkweighers is developed through a fast Fourier transform (FFT) trace of a load cell during operations of the checkweigher. Accuracy data is generated through validation operations of the load cells. Configuration and operations data, including the noise and accuracy data, is received for the checkweighers at one or more servers which classify the noise data by component based on frequency, correlate the accuracy data with magnitude values of the noise data on a component-specific basis to determine a magnitude threshold for each component providing acceptably accurate readings, and generate an alert where a magnitude of the noise data for a given component of a given one of the checkweighers is above the magnitude threshold for the given component.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile